"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and that the costs associated with functional verification are now outweighing the costs of chip design. To cope with these challenges engineers are increasingly relying on new design and verification methodologies and languages. Transaction-based design and verification, constrained random stimulus generation, functional coverage analysis, and assertion-based verification are all techniques that advanced design and verification teams routinely use today. Engineers are also increasingly turning to design and verification models based on C/C++ and SystemC in order to build more abstract, higher performance hardware and software models and to escape the limitations of RTL HDLs. This new book, Advanced Verification Techniques, provides specific guidance for these advanced verification techniques. The book includes realistic examples and shows how SystemC and SCV can be applied to a variety of advanced design and verification tasks." - Stuart Swan

The Accellera Universal Verification Methodology (UVM) standard is architected to scale, but verification is growing and in more than just the digital design dimension. It is growing in the SoC dimension to include low-power and mixed-signal and the system integration dimension to include multi-language support and acceleration. These items and others all contribute to the quality of the SOC so the Metric-Driven Verification (MDV) methodology is needed to unify it all into a coherent verification plan. This book is for verification engineers and managers familiar with the UVM and the benefits it brings to digital verification but who also need to tackle specialized tasks. It is also written for the SoC project manager that is tasked with building an efficient worldwide team. While the task continues to become more complex, Advanced Verification Topics describes methodologies outside of the Accellera UVM standard, but that build on it, to provide a way for SoC teams to stay productive and profitable.

Professional Verification is a guide to advanced functional verification in the nanometer era. It presents the best practices in functional verification used today and provides insights on how to solve the problems that verification teams face. Professional Verification is based on the experiences of advanced verification teams throughout the industry, along with work done at Cadence Design Systems. Professional Verification presents a complete and detailed Unified Verification Methodology based on the best practices in use today. It also addresses topics important to those doing advanced functional verification, such as assertions, functional coverage, formal verification, and reactive testbenches.

This book constitutes the refereed proceedings of the 9th International Haifa Verification Conference, HVC 2013, held in Haifa, Israel in November 2013. The 24 revised full papers presented were carefully reviewed and selected from 49 submissions. The papers are organized in topical sections on SAT and SMT-based verification, software testing, supporting dynamic verification, specification and coverage, abstraction and model presentation.

This book constitutes the refereed proceedings of the 24th International Conference on Computer Aided Verification, CAV 2012, held in Berkeley, CA, USA in July 2012. The 38 regular and 20 tool papers presented were carefully reviewed and selected from 185 submissions. The papers are organized in topical sections on automata and synthesis, inductive inference and termination, abstraction, concurrency and software verification, biology and probabilistic systems, embedded and control systems, SAT/SMT solving and SMT-based verification, timed and hybrid systems, hardware verification, security, verification and synthesis, and tool demonstration.

It is a pleasure to present the proceedings of the 22nd European Conference on Object-Oriented Programming (ECOOP 2008) held in Paphos, Cyprus. The conference continues to serve a broad object-oriented community with a tech- cal program spanning theory and practice and a healthy mix of industrial and academic participants. This year a strong workshop and tutorial program c- plementedthemaintechnicaltrack.Wehad13workshopsand8tutorials,aswell as the co-located Dynamic Language Symposium (DLS). Finally, the program was rounded out with a keynote by Rachid Guerraoui and a banquet speech by James Noble. As in previous years, two Dahl-Nygaard awards were selected by AITO, and for the ?rst time, the ECOOP Program Committee gave a best paper award. Theproceedingsinclude27papersselectedfrom138submissions.Thepapers werereviewed in a single-blind process with three to ?ve reviews per paper. P- liminaryversionsofthereviewsweremadeavailabletotheauthorsaweekbefore the PC meeting to allow for short (500 words or less) author responses. The - sponses were discussed at the PC meeting and were instrumental in reaching decisions. The PC discussions followed Oscar Nierstrasz’Champion pattern. PC papers had ?ve reviews and were held at a higher standard.

This book constitutes the thoroughly refereed post-conference proceedings of the 10th International Conference on Fundamentals of Software Engineering, FSEN 2023, held Tehran, Iran in May 4-5, 2023. The 9 full papers and 2 short papers presented in this volume were carefully reviewed and selected from 19 submissions. The topics of interest in FSEN span over all aspects of formal methods, especially those related to advancing the application of formal methods in the software industry and promoting their integration with practical engineering techniques. The papers are organized in topical sections on coordination, logic, networks, parallel computation, and testing.

This book constitutes the refereed proceedings of the 20th International Conference on Computer Aided Verification, CAV 2008, held in Princeton, NJ, USA, in July 2008. The 33 revised full papers presented together with 14 tool papers and 2 invited papers and 4 invited tutorials were carefully reviewed and selected from 104 regular paper and 27 tool paper submissions. The papers are organized in topical sections on concurrency, memory consistency, abstraction/refinement, hybrid systems, dynamic verification, modeling and specification formalisms, decision procedures, program verification, program and shape analysis, security and program analysis, hardware verification, model checking, space efficient algorithms, and model checking.

Written in an engaging, easy-to-read format by three of the industry's leading experts, Speech Mapping and Probe Microphone Measurements is an essential clinical companion for all practitioners fitting and dispensing hearing aids. The key to successful hearing aid fittings is the patient-specific programming of gain and output. As outlined in all Best Practices Guidelines, the cornerstone of this process is the real-ear verification. Although speech mapping and probe-microphone measures have been used clinically for decades, new techniques and procedures continue to emerge. This is the first handbook to be published in 25 years that is dedicated to this critical clinical measure. Starting with an emphasis on evidenced-based practice, and the need to develop a well-researched gold standard, Speech Mapping and Probe Microphone Measurements takes you through the process of conducting valid and reliable speech mapping testing. Following a review of the basics of signal types, presentation levels, and patient and probe positioning, the chapters flow to the patient-centered real-ear verification process. In addition to extensive step-by-step guidelines regarding the routine testing and adjustment of gain and output, protocols for the evaluation of special features and fittings also are outlined. As a bonus, the authors provide a review of how speech mapping findings can be used with other measures that are part of the overall hearing aid fitting protocol.