Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

"Proceedings A publishes refereed research papers in the mathematical, physical, and engineering sciences. The emphasis is on new, emerging areas of interdisciplinary and multidisciplinary research." Continues: Proceedings. Mathematical and physical sciences.

Contains in full all papers presented at the European Conference on Applications of Surface and Interface Analysis and the extended abstracts. Emphasizing applications of analysis, sections cover metallurgy, catalysis, electronics, semiconductor and thin films, corrosion, adhesion, polymers, ceramics, tribology and environmental features.

The proceedings cover the development and application of the various techniques used in surface and interface related problems, providing an excellent overview of the most recent research and technology in the following fields: Adhesion Biomaterials Catalysis Ceramics Corrosion/Solid Liquid Interfaces Depth Profiling Micro and Optoelectronics Environmental Studies Imaging/High Lateral Resolution Magnetic Materials Metals Nanomaterials Polymers and Composite Materials Data Interpretation and Quantification Synchrotron Radiation Superconductors Thin Films and Coatings Technique Developments Tribology and Wear