Characterization Of Very High Speed Semiconductor Devices And Integrated Circuits

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Genre : Technology & Engineering
Author : Ravi Jain
Publisher :
Release : 1987
File : 378 Pages
ISBN-13 : UOM:39015013829281


Energy Research Abstracts

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Genre : Power resources
Author :
Publisher :
Release : 1990
File : 840 Pages
ISBN-13 : MSU:31293010869141


Microelectronic Failure Analysis Desk Reference

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Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

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Genre : Technology & Engineering
Author :
Publisher : ASM International
Release : 2001-01-01
File : 162 Pages
ISBN-13 : 9780871707451


Physics Briefs

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Genre : Physics
Author :
Publisher :
Release : 1992
File : 812 Pages
ISBN-13 : UOM:39015027735979


High Speed Vlsi Interconnections

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This Second Edition focuses on emerging topics and advances in the field of VLSI interconnections In the decade since High-Speed VLSI Interconnections was first published, several major developments have taken place in the field. Now, updated to reflect these advancements, this Second Edition includes new information on copper interconnections, nanotechnology circuit interconnects, electromigration in the copper interconnections, parasitic inductances, and RLC models for comprehensive analysis of interconnection delays and crosstalk. Each chapter is designed to exist independently or as a part of one coherent unit, and several appropriate exercises are provided at the end of each chapter, challenging the reader to gain further insight into the contents being discussed. Chapter subjects include: * Preliminary Concepts * Parasitic Resistances, Capacitances, and Inductances * Interconnection Delays * Crosstalk Analysis * Electromigration-Induced Failure Analysis * Future Interconnections High-Speed VLSI Interconnections, Second Edition is an indispensable reference for high-speed VLSI designers, RF circuit designers, and advanced students of electrical engineering.

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Genre : Technology & Engineering
Author : Ashok K. Goel
Publisher : John Wiley & Sons
Release : 2007-10-19
File : 433 Pages
ISBN-13 : 9780470165966


Semiconductors And Semimetals

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Semiconductors and Semimetals

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Genre : Technology & Engineering
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Publisher : Academic Press
Release : 1990-04-25
File : 455 Pages
ISBN-13 : 9780080864259


Texas Instruments Technical Journal

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Genre : Computer engineering
Author :
Publisher :
Release : 1997
File : 654 Pages
ISBN-13 : PSU:000051701567


Contactless Vlsi Measurement And Testing Techniques

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This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

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Genre : Technology & Engineering
Author : Selahattin Sayil
Publisher : Springer
Release : 2017-11-16
File : 92 Pages
ISBN-13 : 9783319696737


Microelectronics Failure Analysis

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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

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Genre : Technology & Engineering
Author :
Publisher : ASM International
Release : 2004-01-01
File : 813 Pages
ISBN-13 : 9780871708045


Scientific And Technical Aerospace Reports

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Genre : Aeronautics
Author :
Publisher :
Release : 1995
File : 702 Pages
ISBN-13 : UIUC:30112048646605