The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

Interpretation of Metallographic Structures, Third Edition, is concerned with metallography as a metallurgical tool. It is an organized presentation of specimen microstructures, each chosen for its clarity of illustration and each or in groups forming the pretext for discussions of the interrelation between physical metallurgy and metallography. The focus is on structures characteristic in a physical metallurgy sense, with the purpose of demonstrating that logical framework of interpretation can supplant mental storage of infinite variations. The book contains seven chapters and begins with a discussion of polycrystalline structures. This is followed by separate chapters on the metallography of fracture; crystallization processes including dendritic crystallization, peritectic crystallization, and metastable crystallization; solid state transformations; diffusion and transport processes; procedures for measuring metallographic features; and energy dispersive spectography. This book is directed toward the senior student as a preview of the scope of his subject and to the practicing metallurgist as a reintroduction.

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

This book summarizes the main surface analysis techniques that are being used to study biological specimens/systems. The compilation of chapters in this book highlight the benefits that surface analysis provides. The outer layer of bulk solid or liquid samples is referred to as the surface of the sample/material. At the surface, the composition, microstructure, phase, chemical bonding, electronic states, and/or texture is often different than that of the bulk material. The outer surface is where many material interactions/reactions take place. This is especially true biomaterials which may be fabricated into bio-devices and in turn implanted into tissues and organs. Surfaces of biomaterials (synthetic or modified natural materials) are of critical importance since the surface is typically the only part of the biomaterial/bio-device that comes in contact with the biological system. Analytical techniques are required to characterize the surface of biomaterials and quantify their impact in real-world biological systems. Surface analysis of biological materials started in the 1960’s and the number of researchers working in this area have increased very rapidly since then, a number of advances have been made to standard surface analytical instrumentation, and a number of new instruments have been introduced.

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.

First published in 1992, Environmental Particles describes properties, roles, and methods for the characterization of environmental particles in air, water, sediment, and soil. This book emphasizes modern methods for sampling, instrumental characterization methods, and physical/chemical principles for describing the properties and roles of particles in the environment (particularly their influence on the transport of toxic compounds). It will be an excellent reference source for environmental chemists and physicists, limnologists, oceanographers, air and soil scientists, analytical chemists, environmental engineers, scientists involved in environmental protection, and students.

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.