This first dedicated overview for beam’s eye view (BEV) covers instrumentation, methods, and clinical use of this exciting technology, which enables real-time anatomical imaging. It highlights how the information collected (e.g., the shape and size of the beam aperture and intensity of the beam) is used in the clinic for treatment verification, adaptive radiotherapy, and in-treatment interventions. The chapters cover detector construction and components, common imaging procedures, and state of the art applications. The reader will also be presented with emerging innovations, including target modifications, real-time tracking, reconstructing delivered dose, and in vivo portal dosimetry. Ross I. Berbeco, PhD, is a board-certified medical physicist and Associate Professor of Radiation Oncology at the Dana-Farber Cancer Institute, Brigham and Women’s Hospital and Harvard Medical School.

Ionizing Radiation Detectors for Medical Imaging contains tentechnical chapters, half of which are devoted to radiology and theother half to nuclear medicine. The last chapter describes thedetectors for radiotherapy and portal imaging. Each chapter addressescompletely a specific application. The emphasis is always on detectorfundamentals and detector properties. Where necessary, software andspecific applications are described in depth. This book is intended for graduate and undergraduate students inphysics and engineering who want to study medical imaging. Inaddition, scientists who are working in a specific sub-field ofmedical imaging can acquire from the book an up-to-date description ofthe state of the art in related sub-fields, within the scope ofionizing radiation detectors. Other scientists, as well as physicians, can use the book as a reference for medical imaging

This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.