WELCOME TO THE LIBRARY!!!
What are you looking for Book "Metrology And Theory Of Measurement" ? Click "Read Now PDF" / "Download", Get it for FREE, Register 100% Easily. You can read all your books for as long as a month for FREE and will get the latest Books Notifications. SIGN UP NOW!
eBook Download
BOOK EXCERPT:
Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.
Product Details :
Genre |
: Science |
Author |
: Valery A. Slaev |
Publisher |
: Walter de Gruyter GmbH & Co KG |
Release |
: 2019-12-02 |
File |
: 713 Pages |
ISBN-13 |
: 9783110651317 |
eBook Download
BOOK EXCERPT:
Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.
Product Details :
Genre |
: Science |
Author |
: Valery A. Slaev |
Publisher |
: Walter de Gruyter GmbH & Co KG |
Release |
: 2019-12-02 |
File |
: 558 Pages |
ISBN-13 |
: 9783110652505 |
eBook Download
BOOK EXCERPT:
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
Product Details :
Genre |
: Mathematics |
Author |
: Franco Pavese |
Publisher |
: Springer Science & Business Media |
Release |
: 2008-12-16 |
File |
: 499 Pages |
ISBN-13 |
: 9780817648046 |
eBook Download
BOOK EXCERPT:
The book focuses on the extension of quality-assured measurement and metrology into psychological and social domains. This is not only feasible and achievable, but also a pressing concern. Significant progress in developing a common conceptual system for measurement across the sciences has been made in recent collaborations between metrologists and psychometricians, as reported in the chapters of this book. Modeling, estimation, and interpretation of objectively reproducible unit quantities that support both general comparability and adaptation to unique local circumstances are demonstrated in fields as diverse as artificial intelligence, justice, and beauty perception.
Product Details :
Genre |
: Technology & Engineering |
Author |
: William P Fisher Jr |
Publisher |
: Walter de Gruyter GmbH & Co KG |
Release |
: 2024-09-23 |
File |
: 522 Pages |
ISBN-13 |
: 9783111036496 |
eBook Download
BOOK EXCERPT:
Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.
Product Details :
Genre |
: Technology & Engineering |
Author |
: Tom Proulx |
Publisher |
: Springer Science & Business Media |
Release |
: 2011-05-27 |
File |
: 412 Pages |
ISBN-13 |
: 9781461402282 |
eBook Download
BOOK EXCERPT:
Proceedings of the NATO Advanced Study Institute, Erice, Italy, May 2-12, 1987
Product Details :
Genre |
: Science |
Author |
: V. de Sabbata |
Publisher |
: Springer Science & Business Media |
Release |
: 2012-12-06 |
File |
: 547 Pages |
ISBN-13 |
: 9789400929555 |
eBook Download
BOOK EXCERPT:
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Product Details :
Genre |
: Measurement |
Author |
: Franco Pavese |
Publisher |
: World Scientific |
Release |
: 2012 |
File |
: 468 Pages |
ISBN-13 |
: 9789814397957 |
eBook Download
BOOK EXCERPT:
Most of the software measures currently proposed to the industry bring few real benefits to either software managers or developers. This book looks at the classical metrology concepts from science and engineering, using them as criteria to propose an approach to analyze the design of current software measures and then design new software measures (illustrated with the design of a software measure that has been adopted as an ISO measurement standard). The book includes several case studies analyzing strengths and weaknesses of some of the software measures most often quoted. It is meant for software quality specialists and process improvement analysts and managers.
Product Details :
Genre |
: Computers |
Author |
: Alain Abran |
Publisher |
: John Wiley & Sons |
Release |
: 2010-11-19 |
File |
: 267 Pages |
ISBN-13 |
: 9781118029329 |
eBook Download
BOOK EXCERPT:
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Product Details :
Genre |
: Computers |
Author |
: Theo W. Hänsch |
Publisher |
: IOS Press |
Release |
: 2007 |
File |
: 683 Pages |
ISBN-13 |
: 9781586037840 |
eBook Download
BOOK EXCERPT:
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.
Product Details :
Genre |
: Science |
Author |
: T.J. Quinn |
Publisher |
: IOS Press |
Release |
: 2001-12-18 |
File |
: 836 Pages |
ISBN-13 |
: 9781614990024 |