Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This volume provides an overview of the state of the art in computational accelerator physics, based on papers presented at the seventh international conference at Michigan State University in October 2002. The major topics covered in this volume include particle tracking and ray tracing, transfer map methods, field computation for time dependent M

Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes to high energy particle accelerators, is entirely based on classical mechanics. A question of curiosity is: How is classical charged particle beam optics so successful in practice though the particles of the beam, like electrons, are quantum mechanical? Quantum Mechanics of Charged Particle Beam Optics answers this question with a comprehensive formulation of ‘Quantum Charged Particle Beam Optics’ applicable to any charged particle beam device.

High-energy particle accelerators are as diverse as their uses, which range from scientific research in fields such as high-energy physics, materials science and the life sciences, to applications in industry and medicine. Despite the diversity of accelerators, the particle beams that they are designed to produce behave in ways that share many common features. Beam Dynamics in High Energy Particle Accelerators aims to provide an introduction to phenomena regularly encountered when working with beams in accelerators; from the basic principles of motion of relativistic particles in electromagnetic fields, to instabilities that can affect beam quality in machines operating at high current. This book assumes no prior experience with accelerator physics and develops the subject in a way that provides a solid foundation for more advanced study of specific topics.As well as including numerous revisions and improvements in the text, this second edition features substantial new material, including sections on fringe fields in multipole magnets, Verlet integration for particle tracking, and measurement of beam emittances. References and discussions of current topics have been updated. As with the first edition, the aim is to provide practical and powerful tools and techniques for the study of beam dynamics, while emphasizing the elegance of the subject and helping the reader develop a deep understanding of the relevant physics.

Edited by internationally recognized authorities in the field, this expanded and updated new edition of the bestselling Handbook, containing many new articles, is aimed at the design and operation of modern particle accelerators. It is intended as a vade mecum for professional engineers and physicists engaged in these subjects. With a collection of more than 2000 equations, 300 illustrations and 500 graphs and tables, here one will find, in addition to common formulae of previous compilations, hard to find, specialized formulae, recipes and material data pooled from the lifetime experience of many of the world's most able practioners of the art and science of accelerators.The seven chapters include both theoretical and practical matters as well as an extensive glossary of accelerator types. Chapters on beam dynamics and electromagnetic and nuclear interactions deal with linear and nonlinear single particle and collective effects including spin motion, beam-environment, beam-beam, beam-electron, beam-ion and intrabeam interactions. The impedance concept and related calculations are dealt with at length as are the instabilities due to the various interactions mentioned. A chapter on operational considerations including discussions on the assessment and correction of orbit and optics errors, realtime feedbacks, generation of short photon pulses, bunch compression, phase-space exchange, tuning of normal and superconducting linacs, energy recovery linacs, free electron lasers, cryogenic vacuum systems, steady state microbuching, cooling, space-charge compensation, brightness of light sources, collider luminosity optimization and collision schemes, machine learning, multiple frequency rf systems, FEL seeding, ultrafast electron diffraction, and Gamma Factory. Chapters on mechanical and electrical considerations present material data and important aspects of component design including heat transfer and refrigeration. Hardware systems for particle sources, feedback systems, confinement, including undulators, and acceleration (both normal and superconducting) receive detailed treatment in a sub-systems chapter, beam measurement and apparatus being treated therein as well.A detailed name and subject index is provided together with reliable references to the literature where the most detailed information available on all subjects treated can be found.

The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas,

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Edited by internationally recognized authorities in the field, this expanded and updated new edition of the bestselling Handbook, containing more than 100 new articles, is aimed at the design and operation of modern particle accelerators. It is intended as a vade mecum for professional engineers and physicists engaged in these subjects. With a collection of more than 2000 equations, 300 illustrations and 500 graphs and tables, here one will find, in addition to the common formulae of previous compilations, hard-to-find, specialized formulae, recipes and material data pooled from the lifetime experience of many of the world''s most able practitioners of the art and science of accelerators.The eight chapters include both theoretical and practical matters as well as an extensive glossary of accelerator types. Chapters on beam dynamics and electromagnetic and nuclear interactions deal with linear and nonlinear single particle and collective effects including spin motion, beam-environment, beam-beam, beam-electron, beam-ion and intrabeam interactions. The impedance concept and related calculations are dealt with at length as are the instabilities associated with the various interactions mentioned. A chapter on operational considerations includes discussions on the assessment and correction of orbit and optics errors, real-time feedbacks, generation of short photon pulses, bunch compression, tuning of normal and superconducting linacs, energy recovery linacs, free electron lasers, cooling, space-charge compensation, brightness of light sources, collider luminosity optimization and collision schemes. Chapters on mechanical and electrical considerations present material data and important aspects of component design including heat transfer and refrigeration. Hardware systems for particle sources, feedback systems, confinement and acceleration (both normal conducting and superconducting) receive detailed treatment in a subsystems chapter, beam measurement techniques and apparatus being treated therein as well. The closing chapter gives data and methods for radiation protection computations as well as much data on radiation damage to various materials and devices.A detailed name and subject index is provided together with reliable references to the literature where the most detailed information available on all subjects treated can be found.

Realizing the need of interaction between universities and research groups in industry, the European Consortium for Mathematics in Industry (ECMI) was founded in 1986 by mathematicians from ten European universities. Since then it has been continuously extending and now it involves about all Euro pean countries. The aims of ECMI are • To promote the use of mathematical models in industry. • To educate industrial mathematicians to meet the growing demand for such experts. • To operate on a European Scale. Mathematics, as the language of the sciences, has always played an im portant role in technology, and now is applied also to a variety of problems in commerce and the environment. European industry is increasingly becoming dependent on high technology and the need for mathematical expertise in both research and development can only grow. These new demands on mathematics have stimulated academic interest in Industrial Mathematics and many mathematical groups world-wide are committed to interaction with industry as part of their research activities. ECMI was founded with the intention of offering its collective knowledge and expertise to European Industry. The experience of ECMI members is that similar technical problems are encountered by different companies in different countries. It is also true that the same mathematical expertise may often be used in differing industrial applications.