This collection of critical surveys provides readers with a range of up-to-date work from leading scholars in the area, writing on some of the key issues facing China, as they survey the present and future challenges of the Chinese economy Nine papers provide detailed discussion on key aspects of the past, present and future of the Chinese economy Leaders in their relevant fields of scholarship tackle some of the critical issues facing China Contributors identify common themes, including the household registration system, urbanization, demographic transition, inequality and the sustainability of economic growth Articles provide a critical review of the literature and discuss policy implications and areas for future research

This assessment continues the Office of Technology Assessment's (OTA) exploration of the meaning of industrial policy in the United States context, while also examining the industrial policies of several U.S. economic rivals. The major focus is on electronics, an area which virtually defines "high technology" of the 1980's. The assessment sets the characteristics of the technology itself alongside other forces that exert major influences over international competitiveness. Specific areas addressed include: electronics technology; structure, trade, and competitiveness in the international electronics industry; quality, reliability, and automation in manufacturing; role of financing in competitiveness and electronics; human resources (education, training, management); employment effects; national industrial policies; and U.S. trade policies and their effects. The report concludes by outlining five options for a U.S. industrial policy, drawing on electronics for examples of past and prospective impacts, as well as on OTA's previous studies of the steel and automotive industries. A detailed summary and introductory comments are included. Also included in appendices are case studies in the development and marketing of electronics products, a discussion of offshore manufacturing, and a glossary of terms used in the assessment. (JN)