This book is intended to provide a treatment of the production, properties and applications of X-rays suitable for undergraduate courses in physics. It is hoped that parts of it, at least, will be useful to students on other courses in physics, materials science, metallurgy, chemistry, engineering, etc. at various levels. It is also hoped that parts of it will serve as an introduction to the subject of X-ray crystallography, and to this end the treatment of X-ray diffraction has been designed to show the relation between the simple approach and the more sophisticated treatments. During many years of teaching this subject to Degree, Diploma in Technology and Higher National Certificate students, I have been unable to find a single book which attempts to cover the whole of this field. This lack of a treatment of X-rays and their applications in one volume has prompted me to attempt to fill the gap and this present volume is the result. Obviously in writing such a book I have referred to many existing books and I acknowledge my indebtedness to the authors of all the books which I have used. I believe that all these books are included in the re ferences at the ends of the chapters but if I have omitted any, then my apologies are offered to the authors concerned.

X-ray computed tomography (CT) is a technique that allows non-destructive imaging and quantification of internal features of objects. X-ray CT reveals differences in density and atomic composition and can therefore be used for the study of porosity, the relative distribution of contrasting solid phases and the penetration of injected solutions. In this book, various applications of X-ray CT in the geosciences are illustrated by papers covering a wide range of disciplines, including petrology, soil science, petroleum geology, geomechanics and sedimentology.

The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major

In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser sources. The third section details the main forms of interaction, including the physics of photoelectric absorption, coherent and Compton scattering, diffraction, and refractive, reflective, and diffractive optics. Applications in this section include x-ray spectroscopy, crystallography, and dose and contrast in radiography. A bibliography is included at the end of every chapter, and solutions to chapter problems are provided in the appendix. Based on a course for advanced undergraduates and graduate students in physics and related sciences and also intended for researchers, An Introduction to X-Ray Physics, Optics, and Applications offers a thorough survey of the physics of x-ray generation and of interaction with materials. Common aspects of diverse phenomena emphasized Theoretical development tied to practical applications Suitable for advanced undergraduate and graduate students in physics or related sciences, as well as researchers Examples and problems include applications drawn from medicine, astronomy, and materials analysis Detailed solutions are provided for all examples and problems

Over the last two decades, advances in the design, miniaturization, and analytical capabilities of portable X-ray fluorescence (pXRF) instrumentation have led to its rapid and widespread adoption in a remarkably diverse range of applications in research and industrial fields. The impetus for this volume was that, as pXRF continues to grow into mainstream use, analysts should be increasingly empowered with the right information to safely and effectively employ pXRF as part of their analytical toolkit. This volume provides introductory and advanced-level users alike with readings on topics ranging from basic principles of pXRF and qualitative and quantitative approaches, through to machine learning and artificial intelligence for enhanced applications. It also includes fundamental guidance on calibrations, the mathematics of calculating uncertainties, and an extensive reference index of all elements and their interactions with X-rays. Contributing authors have provided a wealth of information and case studies in industry-specific chapters. These sections delve into detail on current standard practices in industry and research, including examples from agricultural and geo-exploration sectors, research in art and archaeology, and metals industrial and regulatory applications. As pXRF continues to grow in use in industrial and academic settings, it is essential that practitioners continue to learn, share, and implement informed and effective use of this technique. This volume serves as an accessible guidebook and go-to reference manual for new and experienced users in pXRF to achieve this goal.

Small Angle X-Ray and Neutron Scattering with Applications to Geomaterials provides techniques for the analysis of geomaterials, which is of great significance for humans because geomaterials are related to earthquake, resource development, underground spaces, carbon dioxide storage, and more. The book introduces the fundamental theory of small angle X-ray and neutron scattering and covers pore accessibility characterization for natural rocks from four aspects, including quantitative evaluation of pore structure heterogeneity and anisotropy, quantification of pore modification in coals due to pulverization, estimation and modeling of coal pore accessibility, and nanoscale coal deformation and alteration of porosity and pore orientation under uniaxial compression. Finally, interactions between pore structures and fluid behaviors in geomaterials are introduced, along with the connections between small-angle scattering and other techniques (NMR cytophotometry, Transmission Electron Microscopy and synchrotron radiation SAXS and nano-CT) described. - Covers both theory and applications of small angle X-ray and neutron scattering as related to geomaterials - Provides context for using the techniques described in the book in connection with other well-known techniques - Includes analysis methods of interactions between pore structures and fluid behaviors in geomaterials