Reliability Yield And Stress Burn In

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The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

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Genre : Technology & Engineering
Author : Way Kuo
Publisher : Springer Science & Business Media
Release : 2013-11-27
File : 407 Pages
ISBN-13 : 9781461556718


Naval Research Logistics

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Genre : Electronic journals
Author :
Publisher :
Release : 2004
File : 608 Pages
ISBN-13 : UOM:39015058892152


In Line Characterization Yield Reliability And Failure Analysis In Microelectronics Manufacturing

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Genre : Integrated circuits
Author :
Publisher :
Release : 2001
File : 266 Pages
ISBN-13 : UOM:39015047821718


Ieee International Reliability Physics Symposium Proceedings

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Genre : Electronic apparatus and appliances
Author : International Reliability Physics Symposium
Publisher :
Release : 2004
File : 766 Pages
ISBN-13 : UIUC:30112061451016


Reliability Yield And Stress Burn In

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Genre :
Author : Way Kuo
Publisher :
Release : 2014-09-01
File : 424 Pages
ISBN-13 : 1461556724


International Integrated Reliability Workshop Final Report

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Genre : Integrated circuits
Author :
Publisher :
Release : 2005
File : 202 Pages
ISBN-13 : UOM:39015058744502


Optimal Reliability Modeling

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Promotes better ways to diagnose, maintain, and improve existing systems. Existing reliability evaluation models are examined with respect to today's complicated engineering systems that have hundreds of thousands of integrated component designs.

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Genre : Business & Economics
Author : Way Kuo
Publisher : Hoboken, N.J. : J. Wiley
Release : 2003
File : 568 Pages
ISBN-13 : UOM:39015055869625


Proceedings Of The European Symposium On Reliability Of Electron Devices Failure Physics And Analysis

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Genre : Electronic apparatus and appliances
Author :
Publisher :
Release : 1999
File : 472 Pages
ISBN-13 : UIUC:30112047971780


Ieee Vlsi Test Symposium

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Genre : Application-specific integrated circuits
Author :
Publisher :
Release : 2002
File : 504 Pages
ISBN-13 : UOM:39015048297892


Proceedings National Symposium On Reliability And Quality Control

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Genre : Electronic apparatus and appliances
Author : National Symposium on Reliability and Quality Control
Publisher :
Release : 1964
File : 672 Pages
ISBN-13 : UVA:X002304050