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BOOK EXCERPT:
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
Product Details :
Genre |
: Technology & Engineering |
Author |
: Way Kuo |
Publisher |
: Springer Science & Business Media |
Release |
: 2013-11-27 |
File |
: 407 Pages |
ISBN-13 |
: 9781461556718 |
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BOOK EXCERPT:
Product Details :
Genre |
: Electronic journals |
Author |
: |
Publisher |
: |
Release |
: 2004 |
File |
: 608 Pages |
ISBN-13 |
: UOM:39015058892152 |
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BOOK EXCERPT:
Product Details :
Genre |
: Integrated circuits |
Author |
: |
Publisher |
: |
Release |
: 2001 |
File |
: 266 Pages |
ISBN-13 |
: UOM:39015047821718 |
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BOOK EXCERPT:
Product Details :
Genre |
: Electronic apparatus and appliances |
Author |
: International Reliability Physics Symposium |
Publisher |
: |
Release |
: 2004 |
File |
: 766 Pages |
ISBN-13 |
: UIUC:30112061451016 |
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BOOK EXCERPT:
Product Details :
Genre |
: |
Author |
: Way Kuo |
Publisher |
: |
Release |
: 2014-09-01 |
File |
: 424 Pages |
ISBN-13 |
: 1461556724 |
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BOOK EXCERPT:
Product Details :
Genre |
: Integrated circuits |
Author |
: |
Publisher |
: |
Release |
: 2005 |
File |
: 202 Pages |
ISBN-13 |
: UOM:39015058744502 |
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BOOK EXCERPT:
Promotes better ways to diagnose, maintain, and improve existing systems. Existing reliability evaluation models are examined with respect to today's complicated engineering systems that have hundreds of thousands of integrated component designs.
Product Details :
Genre |
: Business & Economics |
Author |
: Way Kuo |
Publisher |
: Hoboken, N.J. : J. Wiley |
Release |
: 2003 |
File |
: 568 Pages |
ISBN-13 |
: UOM:39015055869625 |
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BOOK EXCERPT:
Product Details :
Genre |
: Electronic apparatus and appliances |
Author |
: |
Publisher |
: |
Release |
: 1999 |
File |
: 472 Pages |
ISBN-13 |
: UIUC:30112047971780 |
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BOOK EXCERPT:
Product Details :
Genre |
: Application-specific integrated circuits |
Author |
: |
Publisher |
: |
Release |
: 2002 |
File |
: 504 Pages |
ISBN-13 |
: UOM:39015048297892 |
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BOOK EXCERPT:
Product Details :
Genre |
: Electronic apparatus and appliances |
Author |
: National Symposium on Reliability and Quality Control |
Publisher |
: |
Release |
: 1964 |
File |
: 672 Pages |
ISBN-13 |
: UVA:X002304050 |